The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 1998
Filed:
Sep. 29, 1995
Applicant:
Inventors:
Arun Majumdar, Goleta, CA (US);
Mohammed Dahleh, Goleta, CA (US);
James Samir Ismail, Santa Barbara, CA (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B26D / ; G01B / ;
U.S. Cl.
CPC ...
73863 ; 73105 ; 83919 ;
Abstract
A modified Atomic Force Microscope (AFM), which can machine and image the surface of a sample with nanometer precision in all three orthogonal directions by varying the depth-of-cut of the sample. A multi-repetitive sensor system is provided as is a radially halved quartered electrode to substantially maintain parallelism or substantial parallelism.
Majumdar, Arun. (1998). Automated tool for precision machining and imaging (U.S. Patent No. 5831181). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5831181
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile