The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 1998

Filed:

Aug. 29, 1996
Applicant:
Inventors:

Hiroyuki Yoshimura, Kanagawa, JP;

Takahiro Kudo, Tokyo, JP;

Masami Kishiro, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F / ;
U.S. Cl.
CPC ...
73861357 ; 73861356 ;
Abstract

A vibration type measuring instrument measures at least one of a mass flow rate and a density of a fluid flowing through a straight measurement pipe by vibrating the measurement pipe, obtains a frequency ratio of a resonant frequency of a first vibration mode to a resonant frequency of a second vibration mode of the measurement pipe, and corrects a measured value of at least one of the mass flow rate and the density according to the frequency ratio. The instrument includes a first vibration detector for detecting at least one of a vibration generated in the measurement pipe depending on the mass flow rate and the resonant frequency of the first vibration mode of the measurement pipe; and a second vibration detector for detecting the resonant frequency of the second vibration mode of the measurement pipe. The second vibration detector is provided around an antinode of the second vibration mode of the measurement pipe to improve the detection sensitivity in the second vibration mode.


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