The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 1998

Filed:

Jan. 26, 1996
Applicant:
Inventors:

Yoko Yamauchi, Sagamihara, JP;

Yuji Tamaki, Niiza, JP;

Noboru Fujimaki, Yokohama, JP;

Toshiyuki Obi, Funabashi, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
39518314 ; 39518321 ; 395527 ; 395708 ;
Abstract

An objective of the present invention to provide a system test support system and a system test support method which allows a developer to make a significant test even when the input contents are determined by a plurality of transitions. To achieve this objective, the present invention, by virtue of a software operation specification input, allows a developer to enter a software operation specification using a state transition model. A test sequence is then set up from transition sequence from a plurality of transition sequences and identification setting up feature, subsequently sets up the object identification to indicate the objects associated with the transition. Input items containing an operation that causes an event for each transition and operation targets which indicate the type of object on which the operation will be performed, are set up. The input contents determining feature determines the input contents for testing the test sequence, based on the object identifications and input items associated with a plurality of transitions in the test sequence. Finally, a test specification, complete with the input contents, is outputted by the outputting feature of the invention.


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Yamauchi, Yoko. (1998). System test support system and system test support method (U.S. Patent No. 5828829). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5828829

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