The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 1998

Filed:

Jul. 11, 1996
Applicant:
Inventors:

Shih-Jong J Lee, Bellevue, WA (US);

Chih-Chau L Kuan, Redmond, WA (US);

Wendy R Bannister, Seattle, WA (US);

Paul S Wilhelm, Kirkland, WA (US);

Michael G Meyer, Seattle, WA (US);

Assignee:

NeoPath, Inc., Redmond, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382133 ; 382128 ; 382224 ;
Abstract

A biological specimen classification strategy employs identification and integration of multiple cell patterns. An automated microscope acquires an image of a biological specimen such as a Pap smear and provides an image output to biological classifiers. The classifiers independently detect and classify a number of specimen types and provide classifications to an output field of view integrator. The integrator integrates the classifications. The integrated output then determines whether the classifiers should be reapplied to the image.


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