The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 1998

Filed:

Dec. 27, 1995
Applicant:
Inventors:

Ramanujan S Kashi, Highland Park, NJ (US);

Winston Lowell Nelson, Morristown, NJ (US);

William Turin, East Brunswick, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382119 ;
Abstract

A signature verification method operates by comparing the numerical values of parameters evaluated on a trial signature with stored reference data derived from previously entered reference signatures. The parameters include global features of the signature, and also include a stroke-direction code (SDC) of the signature. An SDC is derived by subdividing the signature into a sequence of time-ordered, spatially oriented line segments, each segment extending between a pair of discrete points along the signature. Each line segment has a stroke-direction value. The SDC is the ordered sequence of these stroke-direction values.


Find Patent Forward Citations

Kashi, Ramanujan. (1998). Method and apparatus for parametric signature verification using global (U.S. Patent No. 5828772). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5828772

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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