The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 1998
Filed:
Dec. 23, 1996
Hui David He, Waukesha, WI (US);
Gary Richard Strong, Waukesha, WI (US);
Thomas Louis Toth, Brookfield, WI (US);
George E Seidenschnur, Waukesha, WI (US);
General Electric Company, Milwaukee, WI (US);
Abstract
The present invention, in one form, is a system which, in one embodiment, varies DAS gain to better accommodate different scanning parameters between different scans, even at the same slice thickness. Specifically, in one embodiment, the DAS gain is varied, or modulated, as a function of slice thickness, x-ray tube current and voltage levels, scan time, and average detector gain. The DAS gain is modulated using a gain factor Gain.sub.-- Fac which is determined in accordance with each of the above-mentioned scanning parameters. The gain factor Gain.sub.-- Fac is then used to determine an appropriate DAS gain for such parameters. Particularly, DAS gains are stored in a look-up table in the CT system computer, and the gain factor Gain.sub.-- Fac is used to select the appropriate DAS gain from the look-up table. The determined DAS gain is then utilized to correct data acquired during a scan.