The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 1998

Filed:

Oct. 21, 1996
Applicant:
Inventors:

Yoshio Urabe, Ibaraki, JP;

Hitoshi Takai, Osaka-fu, JP;

Hidetoshi Yamasaki, Amagasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03D / ; H04L / ;
U.S. Cl.
CPC ...
375330 ; 375324 ; 329304 ;
Abstract

A differential detecting apparatus includes samplers 1 and 2, differential detection calculating unit 3, and two post-detection filters 4 and 5. Differential detection calculating unit 3 performs a differential detection with time-division multiplexing on data output from these samplers and alternately outputs a data sequence of a part of cosine component of the phase difference of the modulated signal and a data sequence of the rest of the cosine component. Differential detection calculating unit 3 also alternately outputs a data sequence of a part of sine component of the phase difference and a data sequence of the rest of the sine component. Each of post-detection filters 4 and 5 includes linear interpolating filter 35 and integral filter 36 which are connected in series. The linear interpolating filter 35 obtains a moving average from successive three pieces of input data weighted by 1:2:1 and the integral filter 36 obtains an integral value from successive k pieces of input data.


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