The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 1998
Filed:
Apr. 28, 1997
Yaron Silberberg, Rehovot, IL;
Yeda Research and Development Co. Ltd., Rehovot, IL;
Abstract
A method for determining the fine structure of materials by means of a nonlinear scanning laser microscope, including the steps of forming an image of a specimen by scanning selected points thereof with a focusable laser beam of a predetermined fundamental frequency w, thereby exciting the points to generate signals constituting the third harmonic 3w of said fundamental frequency w, collecting the signals by collecting means, substantially filtering out from the collected 3w signals, signals of a frequency other than the third harmonic 3w, feeding the filtered 3w signals to a detector, and storing the output of the detector for processing and display. A nonlinear scanning laser microscope adapted to form an image of a specimen by scanning it point by point with a focusable laser beam of a predetermined fundamental frequency, is also provided.