The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 1998
Filed:
Jul. 29, 1996
Applicant:
Inventor:
Gary R Gust, Huntington Beach, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356349 ; 351212 ; 606-4 ;
Abstract
A method and apparatus for non-contact measurement of the precise displacement, movement, and mechanical properties of an eyeball. An optical heterodyne interferometer is provided having a measurement beam and a reference beam. A modulator shifts the frequency of the reference beam. The measurement beam, after reflection from the eyeball, is combined with the reference beam on a heterodyne detector and the relative phase of the reflected beam and reference beam is measured and the ocular displacement is calculated so that physiological properties may be determined.