The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 1998
Filed:
Feb. 25, 1997
Alcan International Limited, Montreal, CA;
Abstract
A device for measuring metal purity, comprising a receptacle for holding a sample of molten metal, the receptacle being made, at least internally, from an insulating refractory material and having a bottom wall provided with a hole containing a filter element. The bottom wall is substantially impermeable to air except at the hold. An enclosed collection vessel is positioned below the receptacle for collecting molten metal which passes through the filter element from the receptacle, the collection vessel having an opening permitting extraction of gas from within the vessel to enable a vacuum to be generated within the vessel during use of the device. A leak-tight seal is established between the receptacle for molten metal and the collection vessel to permit vacuum generated in the collection vessel to draw molten metal into the collection vessel from the receptacle through the filter. The receptacle for molten metal has a heat diffusivity value that is sufficiently low that, in use, the temperature of the molten metal in the receptacle does not fall below the liquidus temperature in a period of time required for the vacuum to draw a fixed amount of molten metal sufficient for metal purity testing purposes through the filter and into the collection vessel from the receptacle. The invention also relates to a corresponding method, and to novel parts of the device.