The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 1998
Filed:
Dec. 30, 1996
Larry Y Mo, Waukesha, WI (US);
Theodore Lauer Rhyne, Whitefish Bay, WI (US);
Steven C Miller, Pewaukee, WI (US);
Christopher J Gilling, Pewaukee, WI (US);
Kok-Hwee Ng, Elkhorn, WI (US);
John E Mahony, Whitefish Bay, WI (US);
General Electric Company, Milwaukee, WI (US);
Abstract
A method using a progressive sampling rate technique to maintain the sampling rate at the Nyquist frequency of the I/Q data through a tunable equalization bandpass filter in the front end of the imager and then increasing the sampling rate via axial interpolation to prevent aliasing during the nonlinear detection process. If an envelope detector is used, the bandwidth of the detector output should be approximately double that of the I/Q data. In this case, the sampling rate is doubled (or more) by axial interpolation before envelope detection. A 2-point linear interpolator can be used. Depending on the application, this axial interpolator can be turned on or off automatically by the system. After detection, the signal can be low-pass filtered to restrict the speckle bandwidth prior to log compression.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile