The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 1998

Filed:

Sep. 30, 1996
Applicant:
Inventor:

Toshiharu Saitoh, South Burlington, VT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F06F / ;
U.S. Cl.
CPC ...
39518318 ; 371 212 ;
Abstract

A method and apparatus for testing or verifying proper operation of a data output system of a memory system are provided. A known data signal is applied to a bit line, independent of the memory cells of the memory system associated with the bit line. Expected outputs of the data output system are determined based upon the formation or configuration of the data output system and the known data signal. Following application of the known data signal to the bit line, actual outputs of the data output system are compared to the expected outputs to verify proper operation of the data output system.


Find Patent Forward Citations

Saitoh, Toshiharu. (1998). Method and apparatus for testing the data output system of a memory (U.S. Patent No. 5826006). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5826006

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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