The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1998
Filed:
Mar. 10, 1997
Yukio Sai, Tokorozawa, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A temperature distribution measuring apparatus and related method uses optical time domain reflectometry to determine temperature distribution along an optical fiber. A light pulse enters the fiber at one end, and backscattered light at each of various points in the optical fiber has a Raman spectrum which contains temperature information. An impulse response to the Raman spectra of backscattered light is produced using a transformation to provide a temperature distribution along the optical fiber. An impulse response on the anti-Stokes component and an impulse response of the Stokes component of the Raman spectrum are each produced, and the ratio between them indicates temperature distribution. Each impulse response is obtained by performing deconvolution on the Stokes component and the anti-Stokes component using an inverse matrix of measured incident light, the inverse matrix being obtained by an iteration method with an optimum number of iterations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile