The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1998
Filed:
Oct. 25, 1996
David M Brudnoy, Albany, NY (US);
Abstract
The present invention is a method and system for detecting a physical feature of a test piece by detecting a pattern in a signal representing data from inspection of the test piece. The pattern is detected by automated additive decomposition of a digital point-ordered signal which represents the data. The present invention can properly handle a non-periodic signal. A physical parameter of the test piece is measured. A digital point-ordered signal representative of the measured physical parameter is generated. The digital point-ordered signal is decomposed into a baseline signal, a background noise signal, and a peaks/troughs signal. The peaks/troughs from the peaks/troughs signal are located and peaks/troughs information indicating the physical feature of the test piece is output.