The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 1998

Filed:

Feb. 27, 1995
Applicant:
Inventor:

Yannick Deville, Villecresnes, FR;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B / ;
U.S. Cl.
CPC ...
364574 ; 102194 ; 364572 ; 702191 ; 381 943 ; 381 941 ; 381 711 ; 381 714 ;
Abstract

A source characterization system (8) which, starting from linear convolutive mixtures E(t) of primary signals X(t) from sources (S1-Sn), determines signals F(t) which form an estimate of a characteristic variable of at least one primary signal X(t). This variable may be an average energy, a spectral density or an autocorrelation function. A pre-processing device (20) enables the signals E(t) from the mixtures to be pre-processed before they are applied to the source separation device (10). The measured variable may serve to retroact on the operation of the sources. The source characterization system may be used for the control of apparatuses for transmitting and/or receiving electric, acoustic or electromagnetic signals.


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