The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1998
Filed:
Dec. 17, 1996
Applicant:
Inventors:
William W Oldfield, Redwood City, CA (US);
Edward Daw, Hollister, CA (US);
Assignee:
Wiltron Company, Morgan Hill, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
36452101 ; 354485 ; 35452104 ; 354487 ; 324601 ; 324638 ;
Abstract
A method for updating automatic calibration to provide a perfect through connection during the calibration of the VNA. After the VNA is initially calibrated, a user may assess the calibration of the through connection to determine if the quality is sufficient. If the quality is insufficient, the user is able to replace the calibration parameters for the through connection used during initial calibration with parameters for a currently used through connection to create a perceived 'perfect' through connection calibration.