The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1998
Filed:
Nov. 13, 1995
Applicant:
Inventors:
Klaus Biber, Aalen, DE;
Fritz Strahle, Heubach, DE;
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
359380 ; 359377 ; 359389 ; 359686 ; 359823 ; 359696 ; 359699 ;
Abstract
A pancratic magnification system for at least two observation beam paths within a stereo microscope consists of a first and a second optical component that are displaceable in a defined manner along a common optical axis, following which a third, stationary, optical component is arranged. Variation of magnification is achieved by means of defined displacement of the first two optical components. A focusing on a desired object plane can be effected by displacement of only the first optical component. The pancratic magnification system is arranged after a common main objective for said at least two observation beam paths within the stereo microscope.