The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1998
Filed:
Sep. 02, 1997
Masatoshi Takano, Tokyo, JP;
Eiji Takasugi, Tokyo, JP;
Shinji Kikuchi, Tokyo, JP;
Tsutomu Sato, Tokyo, JP;
Hiroyuki Saito, Tokyo, JP;
Yoshiyuki Araki, Tokyo, JP;
Mitsunori Iima, Tokyo, JP;
Takashi Sasaki, Tokyo, JP;
Takashi Iizuka, Tokyo, JP;
Asahi Kogaku Kogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
A cascade scanning optical system which includes a first laser scanning optical system for emitting a first laser beam to scan a surface of a member to generate a first scanning line, and a second laser scanning optical system for emitting a second laser beam to scan the surface to generate a second scanning line, wherein the first and second laser scanning optical systems are arranged so as to combine the first scanning line with the second scanning line at a point of contact therebetween in a main scanning direction to form a single scanning line, and wherein each of the first and second laser scanning optical systems is designed as a non-telecentric system through which the incident angle of a corresponding one of the first and second laser beams relative to the surface varies in accordance with a variation in the position of a scanning spot of the corresponding one of the first and second laser beams on the surface in the main scanning direction, and further wherein an incident angle of each of the first and second laser beams relative to the surface in the vicinity of the point of contact is predetermined to be larger than an incident angle of the same in the vicinity of a corresponding one of opposite ends of the single scanning line.