The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1998
Filed:
Mar. 14, 1997
David K Mee, Knoxville, TN (US);
Glenn O Allgood, Powell, TN (US);
Larry R Mooney, Knoxville, TN (US);
Michael G Duncan, Clinton, TN (US);
John C Turner, Clinton, TN (US);
Dale A Treece, Knoxville, TN (US);
Lockheed Martin Energy Systems, Inc., Oak Ridge, TN (US);
Abstract
A structure and yarn sensor for fabric directly determines pick density in a fabric thereby allowing fabric length and velocity to be calculated from a count of the picks made by the sensor over known time intervals. The structure and yarn sensor is also capable of detecting full length woven defects and fabric. As a result, an inexpensive on-line pick (or course) density measurement can be performed which allows a loom or knitting machine to be adjusted by either manual or automatic means to maintain closer fiber density tolerances. Such a sensor apparatus dramatically reduces fabric production costs and significantly improves fabric consistency and quality for woven or knitted fabric.