The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1998
Filed:
Nov. 08, 1996
Matthias Kohl, London, GB;
Mark Cope, Avon, GB;
Matthias Essenpreis, Gauting, DE;
Dirk Boecker, Heidelberg, DE;
Boehringer Mannheim GmbH, Mannheim, DE;
Abstract
A method and an apparatus for determining analytical data concerning the inside of a scattering matrix, in particular of a biological sample. In a detection step detection measurements are carried out in which light is irradiated into the matrix as primary light at an irradiation site (12) through an interface bounding the scattering matrix (6) and light emerging out of the scattering matrix through the interface is detected as secondary light at a detection site (13) at a predetermined measuring distance from the irradiation site, in order to determine as a measurement variable a measurable physical property of the light which varies due to the interaction of the light with the scattering matrix, which measurement variable is a measure of the analytical data to be determined. In an evaluation step the analytical data are determined on the basis of the measurement variable measured in the detection step. In order that such a matrix analysis may be carried out with relatively simple measuring means, at least two detection measurements are carried out in the detection step with different reflection conditions at the interface (5) between the irradiation site (12) and the detection site (13), in each of which the measurement value of the measurement variable is determined.