The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 1998

Filed:

Jun. 21, 1996
Applicant:
Inventor:

Ae-Kyoung Lee, Daejeong, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
343703 ; 455 672 ;
Abstract

A method for measuring radiated emission using a GTEM cell is disclosed in which a DUT is placed inside the GTEM cell, and its power is measured by a power receiver. The direction of the DUT is changed, and then its transmission power is measured. Here, the arrangements of the DUT are fifteen, and their power measurement number is 15. These powers measured are transmitted to a computer system through a GPIB cable, in which the powers are accepted in the form of data in order to calculate emission in OATS. Accordingly, the maximum vertical/horizontal electric field emitted from the DUT in OATS is estimated over the whole band of radiated emission test. This enables a desired emission value to be measured for a short time only utilizing the GTEM cell.


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Lee, Ae-Kyoung. (1998). Radiated emission measuring method using gtem cell (U.S. Patent No. 5825331). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5825331

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