The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1998
Filed:
Oct. 29, 1996
Katsumi Irie, Kashihara, JP;
Nobuyuki Kawase, Tenri, JP;
Takafumi Hayama, Tenri, JP;
Touko Kasahara, Tenri, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
Disclosed herein is a method for detecting a defect of an active matrix liquid crystal panel, the method including a step of inputting a data signal for displaying an image having a luminance level lower than a maximum luminance level to a first signal line while inputting a data signal for displaying a black image to a second signal line and a third signal line, the second signal line and the third signal line adjoining the first signal line, thereby causing pixels corresponding to the first signal line to display a single color. According to the method of the present invention, any defective pixel is displayed darker than normal, owing to a decrease in the transmittance, so that point defects such as S-D leak defects can be easily detected.