The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 1998

Filed:

Sep. 20, 1996
Applicant:
Inventors:

Rohit L Bhuva, Plano, TX (US);

Bao Tran, Richardson, TX (US);

James L Conner, Rowlett, TX (US);

Michael Overlaur, Plano, TX (US);

Tracy S Paulsen, Rowlett, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324763 ; 324765 ;
Abstract

A method of testing a large integrated circuit (10) of modular design. Test equipment is connected to a dedicated testing pad section (20) for each circuit section (22, 24, 34) of each module (12, 14, 16). The circuit section under test is tested via the testing pad adjacent that circuit section. The test equipment is then stepped to the testing section for the next circuit section. When testing is completed, the testing section is then electrically isolated from the circuit sections to prevent interference with operation of the entire circuit (10).


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