The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 1998

Filed:

Mar. 06, 1997
Applicant:
Inventors:

Hideki Kambara, Hachiouji, JP;

Kazunori Okano, Shiki, JP;

Satoshi Takahashi, Kunitachi, JP;

Keiichi Nagai, Higashiyamato, JP;

Kazuko Kawamoto, Kokubunji, JP;

Hiroko Furuyama, Kokubunji, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ;
U.S. Cl.
CPC ...
435-6 ; 935 77 ; 935 78 ;
Abstract

A DNA analyzing method which bonds a first oligomer of known base sequence to a DNA fragment obtained by digesting a DNA sample with a restrictive enzyme. The oligomer and DNA fragment are hybridized to other oligomers which have the sequences of all combinations of the types of bases within the length of several bases following the known base sequence. The presence or absence of hybridization or complementary DNA strand extension is determined and identifies the DNA fragment terminal sequence from this result. The DNA fragments are then fractionated and analyzed to determine the sequence. This DNA analyzing method provides an effective analysis of mixtures of long DNAs or DNA fragments.


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