The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1998
Filed:
Jun. 20, 1996
Applicant:
Inventor:
YuZhong Dai, Coventry, RI (US);
Assignee:
Brown & Sharpe Manufacturing Company, Kingstown, RI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33560 ; 33557 ;
Abstract
A multi-probe system for dimensional metrology. This system utilizes a probe base that is attachable to a coordinate measuring machine and that includes a plurality of probes mounted at spaced-apart locations on the base. The probes are interconnected with the coordinate measuring machine and generate measurement signals based upon interaction with a workpiece. By providing a plurality of probes on a single assembly, multiple measurements can be made on a workpiece in a single measurement cycle.