The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 1998

Filed:

Jul. 14, 1994
Applicant:
Inventors:

Irving S Reed, Santa Monica, CA (US);

Alfred C Yu, Irvine, CA (US);

Assignee:

Johnson-Grace, Newport Beach, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382232 ; 382260 ;
Abstract

A computationally fast, effective method for compressing digital images uses an optimized subsampling process. A set of spatially overlapping spline functions is used as a basis onto which the image data are projected by use of a least-mean-squares criterion. The specified processes can be implemented for compressing and interpolating digital data arrays of N dimensions. Linear, planar and hyperplanar spline functions allow convenient, fast and efficient closed-form optimal compression, which process is easily incorporated into existing digital processing systems. A key advantage of the disclosed method is the fast coding/reconstruction speed, because it involves only FFT or convolution types of processors.


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