The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 1998

Filed:

Dec. 26, 1996
Applicant:
Inventor:

Kristina Helena Hedengren, Schenectady, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
378988 ; 378 19 ; 2502081 ;
Abstract

The present invention discloses a multi-resolution detector for use in an x-ray imaging implementation such as computed tomography and digital radiography. The multi-resolution detector includes a two-dimensional, m.times.n element array of low resolution detector elements and at least one high resolution detector element located about the two-dimensional, m.times.n element array of low resolution detector elements. After an object has been completely scanned with the multi-resolution detector the scan data from both the two-dimensional, m.times.n element array of low resolution detector elements and the high resolution detector element is used to reconstruct a high resolution image. In particular, the scan data generated from the two-dimensional, m.times.n element array of low resolution detector elements is used along with the initial scan data generated from the high resolution detector element to iteratively construct a high resolution image of the object.


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