The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 1998

Filed:

Apr. 03, 1996
Applicant:
Inventor:

Kunio Yamada, Ebina, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B / ;
U.S. Cl.
CPC ...
364148 ; 364149 ; 364159 ;
Abstract

A target density accomplishment line is a line at which a control case plane and a target density plane intersect each other. If present control contents are plotted on the target density accomplishment line, it means that a target density is accomplished. It is not correct to say that any point on the target density accomplishment line can be employed. A point on the target density accomplishment line which should be employed needs to also satisfy optimization rules for respective manipulated variables. By applying bias and laser power optimization rules are applied to the points on the target density accomplishment line, a combination of bias and laser power set values that maximizes the product of bias and laser power optimization rule satisfaction levels is selected.


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