The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 1998

Filed:

Sep. 13, 1996
Applicant:
Inventor:

Hideo Kusuzawa, Kobe, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356343 ; 356338 ; 356339 ;
Abstract

A particle analyzer which can maintain optical characteristics of an optical system which is one component thereof at a fixed level for a long period of time is provided. In the particle analyzer comprising a flow cell for forming a sheathed sample flow containing particulate components; an irradiating optical system for irradiating a sheathed sample flow formed in the flow cell; and a light receiving optical system for receiving light emitted from the sheathed sample flow in the flow cell irradiated by the irradiating optical system, the light receiving optical system comprises a rod lens to which the light emitted from the sheathed sample flow in the flow cell enters and an entrance surface of the rod lens is curved.


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