The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 1998
Filed:
Jul. 01, 1996
Applicant:
Inventors:
Koichi Sugahara, Kanagawa, JP;
Tsutomu Kimura, Kanagawa, JP;
Junji Sugano, Kanagawa, JP;
Jun Nakagawa, Tokyo, JP;
Ryoichi Hayashi, Tokyo, JP;
Assignee:
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Primary Examiner:
Int. Cl.
CPC ...
G03B / ; G03F / ;
U.S. Cl.
CPC ...
355 38 ; 358506 ; 358527 ;
Abstract
An image testing method which improves an image testing ability and enables rapid testing processing. When an operator effects testing for an image displayed at a set test position and instructs alteration of a printing condition set by the testing, the image is scrolled and the next image is displayed at the test position without the altered image being displayed. When the next image is displayed at the test position, the operator starts testing for the next image without moving his/her line of vision.