The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 1998
Filed:
Jul. 31, 1996
Henriecus Koeman, Edmonds, WA (US);
Jeffrey S Bottman, Seattle, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
A pulse-based local area network (LAN) cable test instrument provides a measurement of the cross-talk characteristic of a LAN patch cord as a function of frequency in order to evaluate its relative performance and workmanship of assembly. A LAN cable test instrument applies a test signal in the form of narrow pulses to a selected transmission line of a LAN patch cord while the cross-talk response induced in another transmission line in the same LAN patch cord is measured and stored as a time record in digital memory. The near-end and far-end pulse responses are separated in the time record, leaving only the near-end pulse response. The LAN cable test instrument analyzes the near-end pulse response by performing a discrete Fourier transform on the time record to provide cross-talk versus frequency information. The same test may then be performed on the far-end end of the patch cord to obtain a complete test of the quality of workmanship at both ends of the patch cable.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile