The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 1998

Filed:

Sep. 04, 1997
Applicant:
Inventor:

Haruyoshi Uchiyama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
73800 ; 25027719 ; 356 32 ;
Abstract

The objective of the present invention is to offer an optical fiber strain-measuring apparatus, which allows the measurement of the strain at an arbitrary position within an optical fiber. An optical frequency conversion section 3 shifts, in a step-wise manner for prescribed frequencies, the frequencies of a continuous light emitted from a light source 1. A sound-light switch 4 coverts into pulses the continuous light forwarded from the optical frequency conversion section 3. When those light pulses are entered into a test optical fiber, back-scattered light is generated. An optical directional coupler 11 branches and forwards to an optical ring circuit and to an optical directional coupler 13 the back-scattered light. A photo-electric converter 14 receives employing heterodyne detection and converts into electric signals the synthesized light signals of the back-scattered light forwarded from the optical directional coupler 11 and the continuous light forwarded from the optical directional coupler 2. A signal processing section 18 reads at an arbitrary timing the electric signals, performs necessary processes, and obtains the amount of strain of the test optical fiber 7.


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