The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1998
Filed:
Dec. 20, 1993
Richard Clark Pasco, San Jose, CA (US);
Sorin Vasile Papuc, Santa Clara, CA (US);
Pierre-Alain Cotte, Paris, FR;
Visioneer, Inc., Fremont, CA (US);
Abstract
The present invention relates in general to optical scanning and image processing, and relates more particularly to a document imaging system which detects skew and/or detects size/shape of a document image. Preferred embodiments utilize a background with optical characteristics which contrast with those of the scanned document. In one embodiment, a document imaging system generates scanning signals in response to optical characteristics of a medium such as a sheet of paper, detects transitions in the scanning signal which define points along one or more edges of the medium, establishes a skew angle between the detected edges and a reference orientation, and compensates for skew by modifying the scanning signals as required such that the resultant skew angle is substantially equal to zero. In another embodiment, a document imaging system detects one or more edges of a document, defines a polygon having sides substantially congruent with the detected edges, and establishes the size of the document in response to the polygon.