The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1998
Filed:
Oct. 22, 1996
Earl R Hibbard, Arcadia, CA (US);
James A Cashin, Malibu, CA (US);
Ultra Stereo Labs, Inc., San Luis Obispo, CA (US);
Abstract
The present invention is a system and method to expeditiously and accurately measure the luminance, weave, jump and flicker of an object so that the best luminance available for that object may be achieved by making adjustments to the light source, the reflecting surface and the like. A scanning light receiver which produces a two dimensional optical image of the object whose luminance is to be tested, is set up so that it may view a substantial portion of the object. The light receiver is connected to a analyzer and interface unit ('AIU') to which it sends an electronic image representing the reflected luminance of the object during each scan. The reflected light that is detected by the light receiver is then analyzed by the AIU to determine the luminance levels, weave, jump and flicker of the luminance across a substantial portion of the object by measuring the voltage of each pixel detected by the light receiver measured against the voltage produced by a black level.