The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 1998

Filed:

Nov. 08, 1996
Applicant:
Inventors:

Eva Sevick-Muraca, Lafayette, IN (US);

Joseph Pierce, Lake Jackson, TX (US);

Huabei Jiang, West Lafayette, IN (US);

Jeffery Kao, Lake Jackson, TX (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356336 ; 356342 ;
Abstract

A system and method are disclosed for the self-calibrating, on-line determination of size distribution and volume fraction of a number of particles dispersed in a medium by detecting multiply scattered light from the particles. The multiply scattered light is re-emitted in response to exposure to a light source configured to provide light of time varying intensity at selected wavelengths. The determination includes calculating the isotropic scattering coefficient for the particles at each of a number of wavelengths from the multiply scattered light as a function of an intensity modulation phase shift, and iteratively estimating the size distribution and volume fraction as a function of the isotropic scattering coefficient for each of the wavelengths. An estimation approach based on an expected form of the distribution and the mass of the particles is also disclosed.


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