The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1998
Filed:
Mar. 12, 1996
Applicant:
Inventor:
Daniel E Murnick, Bernardsville, NJ (US);
Assignee:
Rutgers, The State University, Piscataway, NJ (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356311 ; 356308 ; 356315 ;
Abstract
Analytical apparatus and methods for processing multiple samples simultaneously. Radiation such as laser light desirably including plural wavelengths is directed through multiple samples simultaneously, as by directing a beam of radiation along a single path through all of the samples. Response to each wavelength is monitored by monitoring an induced effect, other than the intensity of the applied radiation itself. Useful signal-to-noise ratios are obtained with low absorption in each sample. One sample desirably is of known composition, and serves as an internal calibration standard.