The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1998
Filed:
May. 06, 1996
Jean-Pierre Schott, Weston, MA (US);
Cognex Corporation, Natick, MA (US);
Abstract
A very fast, memory efficient, single-step solution for coarse alignment with determination of angular displacement, and inspection for surface defects on circular objects with non-symmetric patterns and random orientation is described. A suitable geometric partition model of an image is constructed that includes a plurality of spatial bins that can be used for rotation estimation and defect detection. In one embodiment for inspection of circular objects, the geometric partitioning includes 256 spatial bins constituted by concentric circular rings divided into sectors. The number of sectors and thickness of the rings are such that the approximate number of pixels in each region is the same. A set of numbers that encode rotational position and gray level information on the plurality of spatial bins of a reference object are acquired during training and used during run-time wherein the same information relative to a circular object being inspected is computed, and the data are correlated to determine both the coarse rotation and gray level difference in pertinent ones of the plurality of spatial bins.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile