The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1998
Filed:
Jul. 03, 1996
Applicant:
Inventors:
Norman Kung-Po Yeung, Fremont, CA (US);
Edward Tonguk Pak, Fremont, CA (US);
Chia-Chi Chao, Mountain View, CA (US);
James Euisik Yoon, Sunnyvale, CA (US);
Assignee:
Silicon Graphics, Inc., Mountain View, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324763 ; 438 18 ; 324765 ;
Abstract
A method of testing a speed of a semiconductor chip. A test time interval is specified. A test oscillator is fabricated as part of the semiconductor under test. The test oscillator contains elements that simulate a critical path of the semiconductor chip. Hence, the test oscillator's frequency is sensitive to process variations. The number of cycles of the oscillator occurring during the test time interval is counted. Based upon this count value, the speed of the semiconductor chip under test is determined.