The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1998
Filed:
Sep. 25, 1995
Howard Stern, Greenlawn, NY (US);
William E Yonescu, Smithtown, NY (US);
Alex Mauro, Holbrook, NY (US);
Robotic Vision Systems, Inc., Hauppauge, NY (US);
Abstract
A method and apparatus are provided for efficiently using 3-D vision systems to measure selected structural features of objects that have a uniform geometric arrangement. The method and apparatus are particularly well suited for optimizing the 3-D measurement of a multiple lead frame, leads of integrated circuit devices mounted on the multiple lead frame, and ball grid array integrated circuit devices on a wafer. For obtaining the three-dimensional data, corresponding sides of the multiple lead frames or devices are scanned sequentially in a row or column with at least one three dimensional sensor. This scanning procedure is repeated for all rows and columns containing structural features of the devices for which data are to be obtained. The acquired three-dimensional device geometry data are compared with the intended predetermined geometry to produce a signal indicative of a deviation of an actual device geometry from the intended predetermined geometry that exceeds a specified tolerance.