The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1998
Filed:
Aug. 30, 1996
Syed A Rizvi, Downers Grove, IL (US);
Other;
Abstract
A set of mid-infrared transparent elements with new element geometry, design of the optics and radiation path configuration is described. Radiation from the IR microscope objective, after being internally reflected at the element/sample interface is either returned to the objective or is directed through the microscope condenser optics with sample information to the detector system for spectral analysis. Alternatively, the beam may bounce off the element/sample interface either once, twice or multiple times at the same angle of incidence, to allow examination of the micro surface of the sample by internal reflectance as well as transmission of the beam through the same sample area. Further, a method to perform external reflectance measurements at different angles of incidence using the described apparatus is discribed.