The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 1998

Filed:

May. 12, 1997
Applicant:
Inventors:

Alexander Mordehai, Mountain View, CA (US);

Sidney E Buttrill, Jr, Palo Alto, CA (US);

Assignee:

Varian Associates, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250281 ; 250242 ; 250288 ;
Abstract

A mass spectrometer system for performing a separation of ions from neutrals and mass analyzing ions comprising a inductively coupled plasma ion generating source with an ion introducing system, a radio-frequently ion guide and a mass analyzer disposed within a vacuum chamber. The space between the radio-frequency ion guide and the ion introduction system defined an aerodynamic jet region which is used for directing a sample containing ions to be analyzed to the entrance of a radio-frequency ion guide and the via the radio-frequency ion guide to the mass analyzer.


Find Patent Forward Citations

Mordehai, Alexander. (1998). Mass spectrometer system and method for transporting and analyzing ions (U.S. Patent No. 5818041). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5818041

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…