The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 1998

Filed:

Dec. 07, 1995
Applicant:
Inventors:

Yoshihisa Masuo, Kyoto, JP;

Soichi Okuhara, Kyoto, JP;

Manabu Yoshimura, Kyoto, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600547 ;
Abstract

A device for providing data as a guide to health management which is capable of highly accurate measurements measures various characteristics of the body of a subject by electrical measurements of the subject while he or she is grasping handgrips with which the device is equipped. Once measurement has begun, the impedance variability measured by the device is calculated at every sampling period, and if the value of this variability is continuously less than a predetermined amount over a number of samplings, it is concluded that the electrodes which apply a fixed current and the electrodes which detect voltage are making good contact with the subject's hands.


Find Patent Forward Citations

Masuo, Yoshihisa. (1998). Impedance measuring device and a health management device using the same (U.S. Patent No. 5817031). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5817031

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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