The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1998
Filed:
Jul. 31, 1996
Applicant:
Inventors:
Kenichiro Yamazaki, Tokyo, JP;
Kiyotaka Kawase, Niigata, JP;
Toshio Koike, Tokyo, JP;
Susumu Harashima, Tokyo, JP;
Assignee:
Nittco Chemical Industry Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
374-4 ; 374121 ; 374-5 ;
Abstract
A method of detecting a defect on the surface of a structure using an infrared radiometric thermometer. It is determined that there is a lifting defect at a region of the surface if the region has a temperature difference of 0.3.degree. C. or more in comparison with a surrounding region and has an area of 200 cm.sup.2 or more. The temperature of the surface of the structure is obtained using the infrared radiometric thermometer in a period of time from 19:00 p.m. on a day when it is clear at least in the daytime to 4:30 a.m. on the next day.