The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 1998

Filed:

Jul. 10, 1996
Applicant:
Inventors:

Jimmy R Roehrig, Palo Alto, CA (US);

Harlan M Romsdahl, Half Moon Bay, CA (US);

Wei Zhang, Mountain View, CA (US);

Assignee:

R2 Technology, Inc., Los Altos, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; A61B / ;
U.S. Cl.
CPC ...
382130 ; 378 37 ; 382131 ; 382194 ;
Abstract

A method and apparatus for the fast detection of spiculated lesions in a digital mammogram, the method for use in a computer aided diagnosis system for assisting a radiologist in identifying and recognizing the spiculations among a multiplicity of lines corresponding to standard fibrous breast tissue. A line and direction image is created from a digital mammogram, and a region of potential intersection for substantially every pixel in the digital mammogram image is determined. The region of potential intersection for each pixel is a predetermined pattern, such as a high aspect ratio rectangle or trapezoid, positioned around the pixel and rotated in a direction corresponding to direction information for that pixel. The regions of potential intersection are accumulated among the pixels to produce a cumulative array, and information in the cumulative array is processed for identifying spiculations in the digital mammogram.


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