The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 1998

Filed:

Jan. 30, 1996
Applicant:
Inventors:

Shunpei Kimura, Yokohama, JP;

Takaaki Ashinuma, Yokohama, JP;

Tsutomu Shiratori, Tokyo, JP;

Akira Miyashita, Tokorozawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 50 ; 369 54 ; 369116 ;
Abstract

A write test method for use in a recording process for recording information is effected by such that the power of a laser light is modulated to form a high-temperature state and a low-temperature state on a recording medium. First, a predetermined signal is recorded on the recording medium while varying the power level of the laser light. The information recorded on the recording medium is reproduced to detect the power level of the laser light, immediately before formation of the high-temperature state, based on the amplitude of a reproduced signal. The power levels of the laser light for forming the low-temperature state and for forming the high-temperature state are determined on the basis of the detected power level.


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