The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 1998
Filed:
Jun. 10, 1996
Pierre H Brodeur, Smyrna, GA (US);
Yves H Berthelot, Decatur, GA (US);
Joseph P Gerhardstein, Atlanta, GA (US);
Mont A Johnson, Snellville, GA (US);
Abstract
A non-destructive, non-contact testing apparatus and method which generally includes an ultrasonic signal generator for inducing one or more ultrasonic signals in a material and an optical interferometer that includes a laser for illuminating a section of the material and for detecting beat frequencies resulting from reflected light from the material. Deformations in the material as a result of the ultrasonic signal cause the beat frequency to be shifted as a result of the Doppler effect. Such differences in the beat frequency are detected by the system and used as an indication of a characteristic of the material.