The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 1998

Filed:

Mar. 27, 1997
Applicant:
Inventors:

Yasushi Okawa, Kasugai, JP;

Itsushi Nakamura, Nagoya, JP;

Tomio Suzuki, Yokkaichi, JP;

Masahiro Hori, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73587 ; 73799 ; 73801 ; 364508 ;
Abstract

A nondestructive inspection method of inspecting a securing defect of a polymer insulator having an FRP core, an outer cover portion arranged around the FRP core, and at least one metal member secured to at least one end of the FRP core, includes the steps of; measuring an acoustic emission signal generated when the metal member is secured to the FRP core by using compression dies; and determining whether or not the securing defect is generated on the basis of the acoustic emission signal in process. Moreover, the disclosed apparatus performs the nondestructive inspection method mentioned above.


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