The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 1998
Filed:
Aug. 28, 1996
Eddy Chapoteau, Brooklyn, NY (US);
Jonathan Craine, Monsey, NY (US);
Bronislaw P Czech, Peekskill, NY (US);
Anand Kumar, Pleasanton, CA (US);
Koon-wah Leong, Sunnyvale, CA (US);
Bayer Corporation, Tarrytown, NY (US);
Abstract
The present invention relates to a method for the determination of polyvalent metal ions using a sandwich aggregation assay. One or more chelating agents capable of forming at least 2:1 or higher ratio stoichiometry complexes with polyvalent metal ions are attached to a suitable carrier such as latex particles through covalent bonds or by non-covalent interactions, such as hydophobic interactions. Upon complexation with the metal ions, the carriers of the complexing agent aggregate, causing an increase in light absorbance or light scattering which is proportional to the concentration of metal ions in the test sample. The measurement of the light absorbance or light scattering by a suitable instrument, such as a spectrophotometer or nephelometer provides a means for measuring the concentration of metal ions.