The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 1998
Filed:
Oct. 25, 1996
Yasuhiko Morimoto, Yamato, JP;
Takeshi Fukuda, Yokohama, JP;
Shinichi Morishita, Yokohama, JP;
Takeshi Tokuyama, Machida, JP;
International Business Machines Incorporated, Armonk, NY (US);
Abstract
A method is described for finding correlation between a plurality of data having two kinds of numerical attributes and a true-false attribute. The method comprises the steps of: constituting a plane with two numerical attributes, dividing the plane into meshes, and counting the number of data in each mesh (also called a 'bucket') and the number of data whose true-false attribute represents true. If each mesh is assumed to be a pixel, such plane can be considered as a plane image in which the number of data corresponds to brilliance, and the number of data whose true-false attribute represents true corresponds to saturation. The method further includes the step of segmenting an admissible image which is convex along an axis of the plane according to a predetermined condition .theta. to find an area with strong correlation. If the segmented area as the admissible image satisfies the above-described condition such as the maximized support rule, the method also presents the area to the user. In addition, necessary attributes for data included in the area are also extracted from a database, as required.