The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 1998
Filed:
Jun. 27, 1997
Mikael Hedlund, Molndal, SE;
Hans Hogberg, Kumla, SE;
Telefonaktiebolaget LM Ericsson, Stockholm, SE;
Abstract
A method and arrangement for testing circuit boards (60) by creating one or several reference patterns to be compared with a test pattern. The arrangement is provided with at least one measuring probe (50), which cooperates with the circuit board (60), for measuring at least one reference signal or test signal on a reference circuit board and a test circuit board (60) respectively. Further, the arrangement is provided with an analyzer (10,30), which cooperates with the measuring probe (50), to pass on the reference signal or the test signal, whereby the analyzer (10,30) first analyzes the reference signal or the test signal at one frequency and then transforms the reference signal or the test signal to a reference pattern and test pattern respectively. Furthermore, the arrangement is provided with at least one memory (20) which cooperates with said analyzer (10,30) to register said reference pattern or test pattern. The memory (20) is provided with two or several reference patterns when testing a circuit board (60).